text: Institute of Electrical and Electronics Engineers (IEEE), 2015. p. 300-303
  URN: urn:nbn:se:liu:diva-112589DOI: 10.1109/ECCTD.2015.7300008ISI: 000380498200010ISBN: 978-1-4799-9877-7 (print)OAI: oai:DiVA.org:liu-112589DiVA, id: diva2:768523